Ключевые слова: HTS, Bi2212, thin films, sol gel process, substrate LaAlO3, oxygen, control systems, X-ray diffraction, resistivity, temperature dependence, critical temperature, current-voltage characteristics, critical caracteristics, critical current density, texture, microstructure, experimental results
Ключевые слова: power plants, power equipment, FCL resistive, HTS, fault currents, harmonic coefficients, numerical analysis, modeling
Hayashi K., Yamamoto N., Bhattacharyya T., Hagiwara Y., Koto M., Ikawa H., Makishima H., Kasuya G., Kamada T., Tsuji H.
Ключевые слова: medical applications, rotating machines, gantry, magnets
Ключевые слова: rotating machines, generators, transient performance, stability, FCL resistive, modeling, numerical analysis, fault currents
Ключевые слова: ITER, LTS, NbTi, Nb3Sn, cable-in-conduit conductor, jacket, mechanical properties, China, tensile tests
Ключевые слова: power equipment, FCL resistive, HTS, power plants, operational performance, modeling, numerical analysis
Ключевые слова: HTS, coated conductors, cables, ac losses, modeling, numerical analysis
Iijima Y., Fuji H., Kakimoto K., Sutoh Y., Fujita S., Itoh M., Igarashi M., Hanyu S., Tobita H., Nakamura N., Kikutake R., Daibo M., Nagata M.
Ключевые слова: jacket, mechanical properties, tensile tests, ITER, coils toroidal, heat treatment, stress effects, elastic behavior, fracture behavior, microstructure
Ключевые слова: HTS, REBCO, coated conductors, ac losses, numerical analysis, power equipment, electrical circuit, modeling, cables coaxial, power equipment
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Sutoh Y., Itoh M., Igarashi M., Hanyu S., Kutami H., Kikutake R., Daibo M., Suzuki R.
Ключевые слова: HTS, YBCO, coated conductors, cables coaxial, helical winding, ac losses, modeling, numerical analysis
Ключевые слова: patents, HTS, coated conductors transposed, coated conductors multifilamentary, coils, fabrication
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, fabrication, buffer layers, high rate process, microstructure
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Ключевые слова: patents, ac losses, coils pancake, coated conductors, design, power equipment
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, PLD process, long conductors, template layers, fabrication, critical current density, critical caracteristics, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, buffer layers, IBAD process, texture, microstructure, fabrication
Takahashi Y., Sato Y., Honjo S., Masuda T., Shimodate M., Ohkura K., Suzawa C., Uchiyama T., Tetsuji H., Yoshitaka T., Teruo I., Yuh S., Tomotaka G., Atsuya Y., Akimasa Y.
Ключевые слова: patents, fabrication, HTS, MOD process, precursors, YBCO, REBCO, substrate metallic, substrate single crystal
Noji H.(noji@cc.miyakonojo-nct.ac.jp)
Ключевые слова: HTS, Bi2223/Ag, tapes, cables cold-dielectric, cables single phase, ac losses, long conductors, numerical analysis, power equipment
Noji H.(noji@cc.miyakonojo-nct.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, ac losses, self-field effect, cables, experimental results, numerical analysis, power equipment, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, buffer layers, substrate Ni, IBAD process, long conductors, texture, growth rate, fabrication, length
Teranishi R., Fuji H., Izumi T., Aoki Y., Shiohara Y.(shiohara@istec.or.jp), Nomoto S.(s_nomoto@istec.or.jp), Sato A.
Ключевые слова: TFA-MOD process, reel-to-reel process, HTS, YBCO, coated conductors, long conductors, fabrication, growth rate, modeling, numerical analysis, new
Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp), Nakaoka K., Kitoh Y., Nomoto S., Suzuki K.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, review, fabrication
Teranishi R., Fuji H., Aoki Y., Izumi T.(izumi@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Nomoto S.
Ключевые слова: HTS, coated conductors, TFA-MOD process, long conductors, review, YBCO, critical current, thickness dependence, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Fuji H., Izumi T., Shiohara Y., Miyata S., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Nomoto S., Matuda J.
Muroga T., Fuji H., Izumi T., Watanabe T., Yamada Y., Miyata S., Konishi M., Machi T., Ibi A., Kitoh Y., Nakao K.(nakao@istec.or.jp), Aokia Y., Shioharaa Y.
Ключевые слова: HTS, coated conductors, long conductors, YBCO, current distribution, Hall sensor, measurement technique
Fuji H., Izumi T., Aoki Y., Yamada Y.(yamada@istec.or.jp), Nakao K., Chikumoto N., Ibi A., Kitoh Y., Machi T.(machi@istec.or.jp)
Ключевые слова: HTS, coated conductors, long conductors, optical imaging, measurement technique, length
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Yajima A., Matsuda J.S., Koyama S., Nakaoka K.
Ключевые слова: HTS, Bi2223, cables, ac losses, numerical analysis, experimental results, power equipment
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Koyama T., Matuda J.S.
Ключевые слова: HTS, YBCO, coated conductors, reel-to-reel process, TFA-MOD process, current distribution, fabrication
Goto T., Teranishi R., Fuji H., Kaneko A., Murata K., Aoki Y., Yajima A., Yoshinaka A., Nakaoka K., Matsuda J.(jmatsuda@istec.or.jp)
Ключевые слова: HTS, YBCO, YBCO, coated conductors, TFA-MOD process, substrate SrTiO3, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Watanabe T., Yamada Y., Matsuda J.S., Koyama S., Nakaoka K.
Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp), Nakaoka K., Kitoh Y., Nomoto S.
Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Nomoto S.(s_nomoto@istec.or.jp), Sato A.
Ключевые слова: HTS, YBCO, TFA-MOD process, modeling, numerical analysis, fabrication
Saitoh T., Teranishi R., Izumi T., Shiohara Y., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kito Y.
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
Noji H.(noji@cc.miyakonojo-nct.ac.jp), Ooyama S., Nakajima K.
Ключевые слова: HTS, Bi2223, cables, ac losses, test results, numerical analysis, power equipment
Iijima Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Asada S., Izumi T., Shiohara Y., Kaneko A., Honjo T., Matsuda J.S.(jmatsuda@istec.or.jp), Yajima A.
Ключевые слова: HTS, YBCO, coated conductors, microstructure, heat treatment, TFA-MOD process, fabrication, substrate Hastelloy, IBAD process
Iijima Y., Saitoh T., Teranishi R., Tokunaga Y., Asada S., Izumi T., Shiohara Y., Kaneko A., Murata K., Honjo T., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, IBAD process, substrate Hastelloy, critical current, fabrication, critical caracteristics
Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Honjo T., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, substrate SrTiO3, microstructure, critical current density, fabrication, critical caracteristics
Goto T., Teranishi R., Tokunaga Y., Fuji H., Asada S., Izumi T., Shiohara Y., Murata K., Honjo T., Yajima A., Kaneko A.(akaneko@istec.or.jp), Matsuda J.S., Yoshinaka A.
Ключевые слова: HTS, REBCO, coated conductors, TFA-MOD process, substrate SrTiO3, resistivity, fabrication
Iijima Y., Goto T., Muroga T., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Asada S., Shiohara Y., Watanabe T., Honjo T., Izumi T.(izumi@istec.or.jp), Yamada Y., Miyata S., Matsuda J., Yajima A., Yoshinaka A.
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Asada S., Izumi T., Shiohara Y., Kaneko A., Murata K., Honjo T., Tokunaga Y.(tokunaga@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Yoshinaka A.
Ключевые слова: HTS, YBCO, substrate Hastelloy, TFA-MOD process, fabrication, critical current density, critical caracteristics
Noji H.(noji@cc.miyakonojo-nct.ac.jp), Ooyama S., Nakajima K.
Ключевые слова: HTS, Bi2223, cables, ac losses, numerical analysis, power equipment
Ключевые слова: HTS, Bi2223, tapes, ac losses, numerical analysis, cables single phase, power equipment, magnetic properties
Ключевые слова: HTS, Bi2212, tapes, power transmission lines, ac losses, numerical analysis, cables single phase, power equipment, magnetic properties
Iijima Y., Nakamura Y., Saitoh T., Honjo T.(honjo@istec.or.jp), Teranishi R., Tokunaga Y., Fuji H., Shibata J., Asada S., Izumi T., Shiohara Y., Kaneko A., Murata K.
Iijima Y., Saitoh T., Teranishi R., Tokunaga Y., Shibata J., Izumi T., Shiohara Y., Honjo T., Fuji H.(hfuji@istec.or.jp)
Iijima Y., Saitoh T., Teranishi R., Fuji H., Shibata J., Asada S., Izumi T., Shiohara Y., Honjo T., Tokunaga Y.(tokunaga@istec.or.jp)
Iijima Y., Nakamura Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Honjo T.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, microstructure, critical current density, fabrication, critical caracteristics
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.